John Wiley & Sons, 2008. — 529 p.
As the way in which defects modify the properties of a solid has been gradually understood, the concept of a defect has undergone considerable evolution. The advance in understanding of defects has been made hand in hand with the spectacular development of sophisticated experimental techniques. The initial breakthrough was in X-ray diffraction—a technique that still remains as the foundation of most studies. A further change came with the development of transmission electron microscopy that was able, for the first time, to produce images of defects at an atomic scale of resolution. Since then, advances in computing techniques, together with the availability of powerful graphics, have thrown quite new light on the defect structure of materials. This book is aimed at presenting an overview of this information. The material included in this book has been chosen so that not only basics are covered but also aspects of recent research where exciting frontiers lie.
Point Defects
Intrinsic Point Defects in Stoichiometric Compounds
Extended Defects
Structural Aspects of Composition Variation
Defects and Diffusion
Intrinsic and Extrinsic Defects in Insulators: Ionic Conductivity
Nonstoichiometry and Intrinsic Electronic Conductivity
Nonstoichiometry and Extrinsic Electronic Conductivity
Magnetic and Optical Defects
Supplementary Material