Seeck O.H., Murphy B.M. X-Ray Diffraction: Modern Experimental Techniques

Taylor & Francis Group, LLC, CRC Press, Boca Raton, FL, USA, 2014. – 438 p. – ISBN: 9814303593High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.Overview of X-Ray Scattering and Diffraction Theory and Techniques
Scattering and Diffraction Beamlines at Synchrotron Radiation Sources
Micro- and Nanodiffraction
Small-Angle X-Ray Scattering
The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity
Inelastic X-Ray Scattering from Phonons
Magnetic X-Ray Scattering
Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism
Reflectivity at Liquid Interfaces
X-Ray Diffraction at Extreme Conditions: Today and Tomorrow
Synchrotron Tomography
Coherent X-Ray Diffraction Imaging of Nanostructures
X-Ray Photon Correlation Spectroscopy