Stenzel O., Ohlídal M. (Eds.) Optical Characterization of Thin Solid Films

Springer International Publishing AG 2018. — 474 p. — (Springer Series in Surface Sciences 64). — ISBN: 331975324X.This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.Introduction and ModellingCharacterization of Porous Zirconia Samples as an Example of the Interplay Between Optical and Non-optical Characterization Methods
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
Predicting Optical Properties from Ab Initio Calculations
Spectrophotometry and Spectral Ellipsometry
Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry
Data Processing Methods for Imaging Spectrophotometry
In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basics
In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Experimental Technique and Application Examples
Ellipsometry of Layered Systems
Characterization of Defective and Corrugated Coatings
Optical Characterization of Thin Films Exhibiting Defects
Scanning Probe Microscopy Characterization of Optical Thin Films
Resonant Waveguide Grating Structures
Polarization Control by Deep Ultra Violet Wire Grid Polarizers
Scatter and Absorption
Roughness and Scatter in Optical Coatings
Absorption and Fluorescence Measurements in Optical Coatings
Cavity Ring-Down Technique for Optical Coating Characterization