The Surface Science Society of Japan (Eds.) Compendium of Surface and Interface Analysis

Springer, 2018. — 805 p. — ISBN: 978-981-10-6155-4.Резюме Анализа Поверхности и ИнтерфейсаThis book concisely illustrates the techniques of major surface analysis and their applications to a few key examples.
Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.1 Acoustic Microscopy
2 Action Spectroscopy with STM
3 Ambient Pressure X-Ray Photoelectron Spectroscopy
4 Angle-Resolved Ultraviolet Photoelectron Spectroscopy
5 Atom Probe Field Ion Microscope
6 Atomic Force Microscope
7 Auger Electron Spectroscopy
8 Cathodoluminescence
9 Conductive Atomic Force Microscopy
10 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy
11 Dynamic Secondary Ion Mass Spectrometry
12 Elastic Recoil Detection Analysis
13 Electrochemical Atomic Force Microscopy
14 Electrochemical Infrared Spectroscopy
15 Electrochemical Scanning Tunneling Microscopy
16 Electrochemical Second Harmonic Generation
17 Electrochemical Sum Frequency Generation
18 Electrochemical Surface X-Ray Scattering
19 Electrochemical Transmission Electron Microscopy
20 Electrochemical X-Ray Absorption Fine Structure
21 Electrochemical X-Ray Photoelectron Spectroscopy...119
Takuya Masuda22 Electron Backscatter Diffraction
23 Electron Energy-Loss Spectroscopy
24 Electron Probe Microanalysis
25 Electron-Stimulated Desorption
26 Electron-Beam-Induced Current
27 Ellipsometry
28 Environmental SEM (Atmospheric SEM)
29 Environmental Transmission Electron Microscopy
30 Extended X-Ray Absorption Fine Structure
31 Focused Ion Beam Scanning Electron Microscope
32 Force Curve
33 Force Spectroscopy
34 Frequency-Modulation Atomic Force Microscopy
35 Gap-Mode Raman Spectroscopy
36 Glow Discharge Mass Spectrometry
37 Glow Discharge Optical Emission Spectrometry
38 Hard X-Ray Photoelectron Spectroscopy
39 Helium Atom Scattering
40 High-Resolution Elastic Recoil Detection Analysis
41 High-Resolution Electron Energy Loss Spectroscopy
42 High-Resolution Rutherford Backscattering Spectrometry
43 High-Speed Atomic Force Microscopy
44 Imaging Ellipsometry
45 Impact Collision Ion Scattering Spectroscopy
46 Inelastic Electron Tunneling Spectroscopy
47 Infrared External-Reflection Spectroscopy
48 Infrared Reflection–Absorption Spectroscopy
49 Interferometer Displacement Measurement
50 Inverse Photoemission Spectroscopy
51 Kelvin Probe Force Microscope
52 Laser Ionization Secondary Neutral Mass Spectrometry
53 Laser Photoelectron Spectroscopy
54 Lateral Force Microscopy
55 Liquid SPM/AFM
56 Low-Energy Ion Scattering Spectroscopy
57 Low-Energy Electron Diffraction
58 Low-Energy Electron Microscope
59 Magnetic Force Microscopy
60 Matrix-Assisted Laser Desorption/Ionization
61 Medium-Energy Ion Scattering
62 Micro-Raman Spectroscopy
63 Microprobe Reflection High-Energy Electron Diffraction.
64 Multiple-Probe Scanning Probe Microscope
65 Nanoscale Angle-Resolved Photoelectron Spectroscopy
66 Nonlinear Spectroscopy
67 Nuclear Reaction Analysis
68 Optical Microscopy
69 Optical Second-Harmonic Generation Spectroscopy and Microscopy
70 Particle-Induced X-Ray Emission
71 Penning Ionization Electron Spectroscopy
72 Phase Mode SPM/AFM
73 Photoelectron Diffraction
74 Photoelectron Holography
75 Photoelectron Yield Spectroscopy
76 Photoemission Electron Microscope
77 Photoluminescence
78 Photon Emission from the Scanning Tunneling Microscope
79 Photo-Stimulated Desorption
80 Piezoresponse Force Microscope
81 Positron-Annihilation-Induced Desorption Spectroscopy
82 p-Polarized Multiple-angle Incidence Resolution Spectrometry
83 Quartz Crystal Microbalance
84 Reflectance Difference Spectroscopy
85 Reflection High-Energy Electron Diffraction
86 Resonant Inelastic X-Ray Scattering
87 Rutherford Backscattering Spectrometry
88 Scanning Capacitance Microscopy
89 Scanning Electrochemical Microscopy
90 Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry
91 Scanning Electron Microscopy
92 Scanning Helium Ion Microscope
93 Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
94 Scanning Probe Microscopy
95 Scanning Transmission Electron Microscopy
96 Scanning Transmission X-Ray Microscopy
97 Scanning Tunneling Microscopy
98 Scanning Tunneling Spectroscopy
99 Soft X-Ray Absorption Fine Structure
100 Spectroscopic Ellipsometry
101 Spin- and Angle-Resolved Photoelectron Spectroscopy
102 Spin-Polarized Scanning Electron Microscopy
103 Spin-Polarized Scanning Tunneling Microscopy
104 Spin-Resolved Photoemission Electron Microscopy
105 Super-Resolution Microscopy
106 Surface Acoustic Wave
107 Surface Enhanced Raman Scattering
108 Surface Magneto-Optic Kerr Effect
109 Surface Plasmon Resonance
110 Surface Profilometer
111 Surface Sensitive Scanning Electron Microscopy
112 Surface X-Ray Diffraction
113 Surface-Enhanced Infrared Absorption Spectroscopy
114 Synchrotron Radiation Photoelectron Spectroscopy
115 Synchrotron Scanning Tunneling Microscope
116 Thermal Desorption Spectroscopy
117 Time-of-Flight Secondary Ion Mass Spectrometry
118 Time-Resolved Photoelectron Spectroscopy
119 Time-Resolved Photoemission Electron Microscopy
120 Time-Resolved Scanning Tunneling Microscopy
121 Tip-Enhanced Raman Scattering
122 Total Reflection X-Ray Fluorescence
123 Transmission Electron Diffraction
124 Transmission Electron Microscope
125 Ultraviolet Photoelectron Spectroscopy
126 Ultraviolet–Visible Spectrophotometry
127 Vibrational Sum Frequency Generation Spectroscopy
128 X-Ray Absorption Near Edge Structure
129 X-Ray-Aided Noncontact Atomic Force Microscopy
130 X-Ray Crystal Truncation Rod Scattering
131 X-Ray Magnetic Circular Dichroism
132 X-Ray Photoelectron Spectroscopy
133 X-Ray Reflectivity
134 X-Ray Standing Wave Method.